| 발행년도/권호 |
2009 년 / 권호: V.21,no.1,Feb |
| 논문제목1(원어) |
웨이블릿 다해상도 분석에 의한 디지털 이미지 결점 검출 알고리즘 |
| 논문제목2(타언어) |
A Defect Inspection Algorithm Using Multi-Resolution Analysis based on
Wavelet Transform |
| 저자(원어) |
김경준․이창환․김주용 |
| 저자(타언어) |
Kyungjoon Kim, Changhwan Lee and Jooyong Kim |
| 소속(원어) |
숭실대학교 유기신소재‧파이버공학과 |
| 소속(타언어) |
Soongsil University |
| 시작/끝
페이지 |
53 ~ 58 총페이지 : 6 |
| 언어(원어) |
Korean |
| 초록 |
A real-time inspection system has been developed by combining CCD based image processing algorithm and a
standard lighting equipment. The system was tested for defective fabrics showing nozzle contact scratch marks, which were one
of the frequently occurring defects. Multi-resolution analysis(MRA) algorithm were used and evaluated according to both their
processing time and detection rate. Standard value for defective inspection was the mean of the non-defect image feature.
Similarity was decided via comparing standard value with sample image feature value. Totally, we achieved defective inspection
accuracy above 95%. |
| 키워드 |
Digital Textile Printing(DTP), inspection system, real-time image processing, multi-resolution analysis |
| 학회지 |
|
| Reference |
http://www.koreascience.or.kr/article/ArticleFullRecord.jsp?cn=OSGGBT_2009_v21n1_53 |
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